Abstract: In this article, we present a physics-based compact model of flicker noise (low-frequency noise) in ferroelectric (FE) field-effect transistors (FETs). This model predicts the noise due to ...
Abstract: Shape memory alloys (SMAs) are a class of smart materials that exhibit a macroscopic contraction of up to 5% when heated via an electric current. This effect can be exploited for the ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback