System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

As the sophistication of semiconductors continues to grow, so does the need for system-level test (SLT) in production to ensure that high-performance processors, chiplets, and other advanced devices ...

Heterogeneous integration and sophisticated packaging are making chips more difficult to test, necessitating more versatile and efficient testing methods to minimize the time and cost it takes for ...