Abstract: A machine learning-based multifunctional antenna array design scheme (ML-MAADS), including a structure design module and a scattering beam steering module, is proposed for the ...
Abstract: Wafer map defect pattern recognition is an indispensable component of semiconductor manufacturing, providing crucial information for identifying the root causes of defects in semiconductor ...
Department of Chemistry, Faculty of Science, University of Helsinki, P.O. Box 55 (A.I. Virtanens plats 1), Helsinki FIN-00014, Finland ...
The final, formatted version of the article will be published soon. Diagnosing Autism Spectrum Disorder (ASD) in verbally fluent individuals, based on speech patterns in examiner-patient dialogues ...
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