Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...
A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...
Kim Jong Un, the North Korean State Affairs Commission Chairperson, has formalized the parallel policy of nuclear forces and conventional forces at the 9th Party Congress to be held next year.
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