Abstract: The Wafer Acceptance Test (WAT) is a significant quality control measurement in the semiconductor industry. However, because the WAT process can be time-consuming and expensive, sampling ...
Programming efficient asynchronous systems is challenging because it can often be hard to express the design declaratively, or to defend against interleaving-dependent bugs such as data races and ...
Abstract: The Internet of Things (IoT) technology development speed, along with its integration into smart city infrastructure, requires strong cybersecurity solutions to protect important systems.
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