With Design-For-Test (DFT), test coverage is the typical yardstick used to gauge the quality of the manufacturing tests being performed. But as next-generation designs become more complex, traditional ...

Techniques that reduce the difficulty and cost associated with testing an integrated circuit. This can result in a decrease in the time spent on a tester, a decrease in cost associated with generating ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

Delivers complete design and validation solution for Low-Power Double Data Rate 6 (LPDDR6) memory in mobile, client computing, and AI applications. Supports JEDEC’s ongoing development of the new ...

Taken literally, embedded test is just that: test capabilities that exist wholly embedded within a system. Power-on self-test is an example as is a built-in performance-monitoring feature programmed ...

As technology shrinks, Yield and Reliability (YAR) are major challenges of SoC (System on Chip) production. There are many techniques available for increasing YAR. YAR of devices depend on testing ...