EDN

Cadence Modus Test Solution Enables Support for Safety-Critical SoC Designs Using ARM MBIST Interface

Through Cadence's support of the ARM MBIST interface, customers can deliver innovative SoC designs to market faster and with better power, performance and area (PPA). For example, the Modus Test ...
CNN

AltaSens Adopts Cadence Modus Test Solution for Mixed-Signal Image Sensor Designs

Cadence Modus Test Solution's seamless integration with digital and verification tools enabled AltaSens to meet test coverage goals and save weeks on design convergence SAN JOSE, Calif., Jan. 11, 2017 ...
EDN

Modus Test to support Wells-CTI socket tester

Modus Test has signed an agreement with Wells-CTI to becomethe exclusive supplier of interface boards and universal manual actuators forthe Wells-CTI CR-2601 automated contact-resistance socket tester ...
Semiconductor Engineering

Beyond The Bottleneck: 3 Breakthroughs In High-Throughput Connector Testing

In any production environment, testing components quickly and accurately is a dual challenge. A solution from Modus Test addresses this by combining an MPT tester with an MTC cycler —a setup that ...