Measures total hemispherical reflectance, 3 to >35 micrometers, and performs integrated total hemispheric reflectance measurement, 250 nm to 2500 nm. The TESA 2000, by virtue of an advanced optical ...
Measures spectral IR total hemispherical reflectance, 2.5-25 microns (most surfaces). Integration of reflectance is used to calculate and display emittance. A unique instrument for easily and quickly ...
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