The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Have you ever designed a product that you thought was ready to ship only to have it fail testing by not meeting safety requirements? Months can be lost and mistakes repeated if a company doesn’t have ...

Consumer products, such as these water heaters, are rigorously tested before being certified as meeting safety and performance standards. Whether you design industrial equipment or the latest consumer ...

Hardware-in-the-loop (HIL) testing is a technique used to develop and test complex real-time embedded systems. HIL simulation provides an effective testing platform by adding the complexity of the ...

Connected devices and systems have become an integral part of our everyday life and we take this for granted. Finding the fastest way to our destination with a smartphone, reading the news on a tablet ...

Understand why testing must evolve beyond deterministic checks to assess fairness, accountability, resilience and ...