The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...
Changing market forces are making design-for-testability tools a more critical part of the savvy design engineer’s toolset Design for testability (DFT) is not a new concept. But the reasons why ...
Design for testability (DFT), a way to build testability into an integrated circuit (IC) at the design stage to lower testing costs and increase manufacturing yield, has been around for many years in ...
As gate counts continue to swell at a rapid pace, modern systems-on-chip (SoCs) are increasingly integrating more design-for-testability (DfT) capabilities 1. Test and diagnosis of complex integrated ...
A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...
Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...
This paper discusses one of the Siemens EDA shift-left strategies in the RTL-to-signoff flow: shift-left design-for-test (DFT). Tessent RTL Pro software automates the analysis and insertion of Tessent ...
Atrenta Inc., the leading provider of SoC Realization solutions for the semiconductor and consumer electronics industries, announced that MediaTek has adopted Atrenta's SpyGlass DFT (Design for Test) ...
JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...
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